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Gold Testing Machine XAN 215 XAN 215

  • Gold Testing Machine XAN 215 XAN 215

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Description

Gold Purity Testing Machine for Jewellery Retail Stores: XAN 215 is exceptionally designed entry-level X-ray fluorescence measurement instrument used for fast as well as non-destructive analysis along with coating thickness measurement of different metals like gold, silver alloys. The Gold Testing Machine XAN 215 is also ideal during non-destructive analysis of coins, jewellery, and precious metals. They are highly useful for the study of precious metals as well as their alloys for composition and coating thickness up to 24 elements in the variety of chlorine (17) to uranium (92).
Our range of machine in assaying centers: XAN 215 is widely acclaimed for exceptional accuracy and high stability. They are acknowledged for time saving property as well as longer service life. Fitted with modern silicon PIN detector, the machines ensure high accuracy and excellent detection sensitivity.

Product Features

  • Excellent accuracy in analysis as well as coating thickness measurement
  • Reduces the recalibration requirements to save time and effort
  • Available with PIN detector for high precision
  • Most advantageous detection sensitivity

Application Areas:

  • Alloys and coatings
  • Dental alloys
  • Jewellery
  • Multi layer coatings
  • Platinum and silver
  • Precious metals
  • Rhodium
  • Yellow and white gold

Product Specifications

 

Intended use: Energy dispersive X-ray measuring device (EDXRF) to examine precious metals and their alloys in composition and thickness of coating.

Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously

Repeatability: <1 %o for gold,measurement time 60 sec

Design:Bench top unit with towards the front opening hood

Measuring direction: Bottom up

X-Ray Source

X-ray tube Tungsten tube, thermally stabilized

High voltage Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator): 1 mm (39 mils), optional 2 mm (79 mils)

Measurement spot: Aperture diameter plus 200 1/4m (8 mils),at measurement distance MD= 0mm

X-Ray Detection

X-ray detector Silicon PIN detector with peltier cooling

Resolution (fwhm for Mn-Ka) 180 eV

Measuring distance (0 – 25 mm (0 -¦ 1 in) Distance compensation with DCM method for easy measurements at unstable distances. For meticulous applications or higher demands on accuracy an extra calibration might be essential.

Sample Alignment

Sample positioning Manually

Video microscope High-resolution CCD color camera for excellent optical monitoring of the capacity location along the primary beam axis, Crosshairs with a calibrated scale (ruler) and Adjustable LED illumination spot-indicator.

Zoom factor Digital 1x, 2x, 3x, 4x

Sample Stage

Design Fixed sample support

Usable sample 310 x 320 mm (12.2 x 12.6 in)

placement area

Max. sample weight 13 kg (29 lb)

Max. sample height 90 mm (3.5 in)

Electrical Data

Power supply AC 115 V or AC 230 V 50 / 60 Hz

Power consumption max. 120 W, without evaluation PC

Protection class IP40

Dimensions

External dimensions Width x depth x height [mm]: 403 x 588 x 365 mm, [in]: 15.9 x 23.1 x 14.4

WeightApprox. 45 Kg (99 lb)

Environmental Conditions

Operating temperature 100C€“ 40oC / 50oF €“ 104oF

Storage/Transport 0oC -€“ 50oC / 32oF €“ 122oF temperature

Admissible air humidity 95 %, non-condensing

Evaluation Unit

Compute rWindows®-PC

Software Standard: Fischer WinFTM® BASIC including PDM®,

Optional: Fischer WinFTM® SUPER

Standards

CE approval EN 61010

X-Ray standards DIN ISO 3497 and ASTM B 568

Approval Fully protected instrument with type approval according to the German regulations “Deutsche Rontgenverordnung-RoV”.

 

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